Root damage is primarily caused by corn rootworm larval feeding. Every root node nibbled by larvae can result in a yield loss of approximately 15%.¹ In addition, root lodging can impede harvesting, further reducing grain yield by 15%–34%.²
* 34 2021 Bayer Trials in the corn belt (KS, CO, NE, IA, IL, ND, SD, OH, MN) in medium to very high CRW pressure environments (as shown by a Node Injury Score of 0.76-3.0 on a 0-3 scale in the non-CRW traited check) vs SmartStax® RIB Complete® Corn Blend, Agrisure Duracade® E-Z Refuge®, Qrome® and Optimum® AcreMax® Xtreme products in the 95-115 RM range with comparable trait packages
1. Journal of Applied Entomology 137 (2013): Validation of a nested error component model to estimate damage caused by corn rootworm larvae. N.A.Tinsley, R.E.Estes & M.E.Gray.
2. Spike BP, Tollesfon JJ, 1991. Yield response of corn subjected to western corn rootworm (Coleoptera:Chrysomelidae) infestation and lodging. J. econ Entomol. 84, 1585-1590.